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| 編號 | 中文名稱 | 英文名稱 |
|---|---|---|
| EN 168100 | 分規(guī)范：石英晶體元件(能力批準)(包括修改A1和A2) | Sectional specification: Quartz crystal units (capability approval) (includes amendments A1 and A2:1993) |
| EN 168101 | 空白詳細規(guī)范：石英晶體元件(能力批準) | Blank detail specification: Quartz crystal units (capability approval) |
| EN 168200 | 分規(guī)范：石英晶體元件(鑒定批準) | Sectional specification; Quartz crystal units (qualification approval) |
| EN 168201 | 空白詳細規(guī)范：石英晶體元件(鑒定批準) | Blank detail specification: quartz crystal units (qualification approval) |
| EN 169000-1992+A1 | 通用規(guī)范：石英晶體振蕩器 | Generic specification: quartz crystal controlled oscillatores |
| EN 169200 | 分規(guī)范：石英晶體振蕩器(鑒定批準) | Sectional specification: Quartz crystal controlled oscillators (Qualification approval) |
| EN 169201 | 空白詳細規(guī)范：石英晶體振蕩器(鑒定批準) | Blank detail specification: Quarz crystal controlled oscillators (Qualification approval) |
| EN 60122-1 | 經質量評定的石英晶體元件 第1部分：通用規(guī)范 | Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002) / Note: Endorsement notice |
| EN 60122-3 | 經質量評定的石英晶體元件 第3部分：標準外形和引線連接 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections (IEC 60122-3:2001) |
| EN 60444-1-1997+A1 | 用π型網絡零相位技術測量石英晶體元件參數(shù) 第1部分：用π型網絡零相位技術測量石英晶體元件的諧振頻率和 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network (IEC 60444-1: |
| EN 60444-2 | 用π型網絡零相位技術測量石英晶體元件參數(shù) 第2部分：測量石英晶體元件動態(tài)電容的相位偏置法 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980) |
| EN 60444-3 | 用π型網絡零相位技術測量石英晶體元件參數(shù) 第3部分：利用有并聯(lián)電容Co補償?shù)摩行途W絡相位技術測量頻率達2 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance co (IEC 60444-3:1986) |
| EN 60444-4 | 用π型網絡零相技術測量石英晶體元件參數(shù) 第4部分：負載諧振頻率fL.負載諧振電阻RL的測量方法及其他導出q | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL,load resonance resistance RL and the calculation of other derived values of q |
| EN 60444-5 | 石英晶體元件參數(shù)的測量 第5部分：采有自動網絡分析技術和誤差校正法來測定等效電參數(shù)的方法 | Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction (IEC 60444-5:1995) |
| EN 60444-6 | 石英晶體元件參數(shù)的測量 第6部分：激勵電平相關性（DLD）的測量 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:1995) |
| EN 60444-8 | 石英晶體元件參數(shù)的測量： 第6部分：石英晶體元件表面安裝的試驗裝置 | Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003) / Note: Endorsement notice |
| EN 60455-3-2 | 電氣絕緣用電抗性化合物樹脂 第3部分：單項材料規(guī)范 活頁2：填石英的環(huán)氧樹脂化合物 | Resin based reactive compounds used for electrical insulation - Part 3: Specifications for individual materials; Sheet 2: Quartz filled epoxy resinous compounds (IEC 60455-3-2:2003) / Note: Endorsement notice |
| EN 60679-1-1998+A1-2002+A2 | 經質量評估的石英晶體受控振蕩器 第1部分：.總規(guī)范 | Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:1997) |
| EN 60679-3 | 經質量評估的石英晶體震蕩器 第3部分：標準外形和引線連接 | Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 60679-3:2001) |
| EN 60679-4-1 | 經質量評估的石英晶體受控振蕩器 第4-1部分：空白詳細規(guī)范 性能鑒定 | Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval (IEC 60679-4-1:1998) |
| EN 60679-4 | 石英晶體受控振蕩器 第4部分：.分規(guī)范 能力鑒定 | Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval (IEC 60679-4:1997) |
| EN 60679-5-1 | 經質量評估的石英晶體受控振蕩器 第5-1部分：空白詳細規(guī)范 鑒定批準 | Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval (IEC 60679-5-1:1998) |
| EN 60679-5 | 經質量評估的石英晶體受控振蕩器 第5部分：分規(guī)范 鑒定批準 | Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval (IEC 60679-5:1998) |
| EN 60682-1993+A2 | 石英鹵鎢燈夾封部位溫度標準測量方法 | Standard method of measuring the pinch temperature of quartz-tungsten-halogen lamps (IEC 60682:1980 + A1:1987) |
| EN ISO 3262-13 | 涂料用填充劑 規(guī)范和測試方法 第13部分：天然石英(礦物) | Extenders for paints - Specifications and methods of test - Part 13: Natural quartz (ground) (ISO 3262-13:1997) |
| EN ISO 3262-15 | 涂料用填充劑 規(guī)范和測試方法 第15部分：透明石英 | Extenders for paints - Specifications and methods of test - Part 15: Vitreous silica (ISO 3262-15:2000) |
| EN ISO 3262-19 | 涂料用填充劑 規(guī)范和測試方法 第19部分：沉淀二氧化硅(石英) | Extenders for paints - Specifications and methods of test - Part 19: Precipitated silica (ISO 3262-19:2000) |
| EN ISO 3262-20 | 涂料用填充劑 規(guī)范和測試方法 第20部分：噴霧二氧化硅(石英) | Extenders for paints - Specifications and methods of test - Part 20: Fumed silica (ISO 3262-20:2000) |
| EN ISO 3262-21 | 涂料用填充劑 規(guī)范和測試方法 第21部分：石英沙(礦物天然石英) | Extenders for paints - Specifications and methods of test - Part 21: Silica sand (unground natural quartz) (ISO 3262-21:2000) |
| prEN 13614-1 | 瀝青和瀝青粘合劑 用水浸沒試驗測定瀝青乳液的粘著力 第1部分：石英巖碎屑法 | Bitumen and bituminous binders - Determination of adhesivity of bitumen emulsions by water immersion test - Part 1: Quartzite chippings method |
| prEN 4438 | 航空航天系列 金屬材料 試驗方法 用透明石英膨脹儀測試固體材料線性熱膨脹 | Aerospace series - Metallic materials - Test methods - Linear thermal expansion of solid materials with a vitreous silica dilatometer |
| 編號 | 中文名稱 | 英文名稱 |